The Center for Nanostructure Characterization in the
School of Materials Science and Engineering, is a multi-user
facility.
Its mission is to provide the Georgia Tech campus
with imaging and characterization tools for performing advanced
research on a variety of
nanoscale materials.
Instruments
Scanning Electron Microscopes: LEO 1530 (T-FE), LEO 1550 (T-FE), Hitachi
S-800 (FEG)
Transmission Electron Microscopes:
JEOL 100CX II,
Hitachi HF-2000 (FEG), JEOL 4000EX
X-ray Diffractometers:
PANalytical X'Pert PRO
Atomic Force Microscope
Nanoindenter: XP by MTS Systems
Ultramicrotome
| 
