Georgia Institute of Technology

 

Center for Nanostructure Characterization

 

Instrument Scheduling

FIB2 Center HomepageFIB Training Schedule

 

Contact us

                                                 


 

The Center for Nanostructure Characterization in the School of Materials Science and Engineering, is a multi-user facility.

Its mission is to provide the Georgia Tech campus with imaging and characterization tools for performing advanced research on a variety of

nanoscale materials.

 Instruments

Scanning Electron Microscopes: LEO 1530 (T-FE), LEO 1550 (T-FE), Hitachi S-800 (FEG)

Transmission Electron Microscopes: JEOL 100CX II, Hitachi HF-2000 (FEG), JEOL 4000EX

X-ray Diffractometers: PANalytical X'Pert PRO

Atomic Force Microscope

Nanoindenter: XP by MTS Systems

Ultramicrotome

serviceupdate