WELCOME
Location: 500 Tenth Street, NW, IPST building, Atlanta, GA 30318
The Center for Nanostructure Characterization in the School of Materials Science and Engineering is a multi-user facility.
Its mission is to provide the Georgia Tech campus with imaging and characterization tools for performing advanced research on a variety of nanoscale materials.
INSTRUMENTS |
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| Scanning Electron Microscopes: LEO 1530 (T-FE), LEO 1550 (T-FE), Hitachi S-800 (FEG), JEOL JSM-6400 | ||
| Transmission Electron Microscopes: JEOL 100CX II, Hitachi HF-2000 (FEG), JEOL 4000EX | ||
| X-ray Diffractometers: PANalytical X'Pert PRO | ||
| Atomic Force Microscope - Veeco Instruments Brand | ||
| Nanoindenter: XP by MTS Systems | ||
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SERVICE UPDATE - Instrument statuses
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